The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2013
Filed:
Jan. 19, 2007
Applicants:
Hyun-jin Choi, Seoul, KR;
Kyung-im Jung, Seongnam-si, KR;
Myung-june Jung, Suwon-si, KR;
Inventors:
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided are an apparatus and method of measuring integrity, in which unnecessary memory loading of an object for measuring integrity is avoided. The apparatus includes a mapping module loading at least one second object, among a plurality of second objects divided from a first object in accordance with an allocation unit of a memory, into the memory, a memory module storing a hash value of the divided second object, and a measurement module measuring integrity of the first object by comparing a hash value of the loaded at least one second object with the hash value stored in the memory module.