The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2013

Filed:

Apr. 08, 2010
Applicants:

Fabian Moerchen, Rocky Hill, NJ (US);

Dmitriy Fradkin, Princeton, NJ (US);

Inventors:

Fabian Moerchen, Rocky Hill, NJ (US);

Dmitriy Fradkin, Princeton, NJ (US);

Assignee:

Siemens Corporation, Iselin, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 7/36 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

An approach is provided for condition monitoring from log messages and sensor trends based on time semi-intervals. The approach may be applied to machine condition monitoring. Patterns are mined from symbolic interval data that extends previous approaches by allowing semi-intervals and partially ordered patterns. The semi-interval patterns and semi-interval partial order patterns are less restrictive than patterns using Allen's relations. Combinations and adaptations of efficient algorithms from sequential pattern and itemset mining for discovery of semi-interval patterns are described.


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