The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2013
Filed:
Apr. 05, 2006
Jan Genoe, Messelbroek, BE;
Paul Heremans, Leuven, BE;
Jan Genoe, Messelbroek, BE;
Paul Heremans, Leuven, BE;
IMEC, Leuven, BE;
Abstract
In the present invention a novel method and device for measuring characteristics from a relatively weak signal comprising desired and undesired components is presented. Undesired signals may arise from the nature of the characteristic, from the detector or from the circuitry. The signal is extracted from a first measurement element () comprising these desired and undesired components. Using another signal from this first measurement element or from another second measurement element () the undesired components can be eliminated. The measurement method is extremely useful when using organic materials for the detectors, electronic circuitry, and measurement elements. These devices can be produced relatively cheap, but less reliable. They can also be combined in a one- or two-dimensional array for measuring characteristics over a larger area.