The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2013
Filed:
Dec. 01, 2009
Augustine Tsai, Taipei, TW;
I-chou Hong, Dongshan Township, Yilan County, TW;
Sung-chun Liang, Taipei, TW;
Fu-chun Hsu, Taipei, TW;
Augustine Tsai, Taipei, TW;
I-Chou Hong, Dongshan Township, Yilan County, TW;
Sung-Chun Liang, Taipei, TW;
Fu-Chun Hsu, Taipei, TW;
Institute For Information Industry, Taipei, TW;
Abstract
A three-dimensional image analysis system, a process device for use in the three-dimensional image analysis system, and a method thereof are provided. The three-dimensional image analysis system is configured to generate a plurality of three-dimensional data of a three-dimensional image. The process device defines a plurality of horizontal scan lines and a plurality of vertical scan lines according to the three dimensional data, determines a preliminary edge information of the three-dimensional image according to the horizontal scan lines and the vertical scan lines, divides the three dimensional data into a plurality of groups, compares the groups to determine a plane information of the three-dimensional image, and determines an edge information of the three-dimensional image according to the preliminary edge information and the plane information. The method is adapted for the process device.