The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2013
Filed:
Feb. 17, 2011
Yutaka Kato, Uji, JP;
Shiro Fujieda, Otokuni-gun, JP;
Yutaka Kiuchi, Souraku-gun, JP;
Shohei Nakaoka, Ayabe, JP;
Yutaka Kato, Uji, JP;
Shiro Fujieda, Otokuni-gun, JP;
Yutaka Kiuchi, Souraku-gun, JP;
Shohei Nakaoka, Ayabe, JP;
OMRON Corporation, Kyoto-shi, JP;
Abstract
An edge code histogram of a model generated in a model image is registered. A target region with respect to the input image is set. An edge code histogram for the target region is generated. A relative positional relationship between the edge code histogram of the model and the edge code histogram for the target region is sequentially changed, and a degree of coincidence between the edge code histograms at each relative position is calculated. A possibility that the region that matches the model is contained in the set target region from the sequentially calculated degree of coincidence between the edge code histograms is evaluated. Then a candidate point having a possibility of matching the model in the input image is specified while sequentially changing the position of the target region with respect to the input image and repeating steps above for each target region.