The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2013
Filed:
Apr. 27, 2010
Applicants:
E. Mark Haacke, Grosse Pointe Farms, MI (US);
Jaladhar Neelavalli, Detroit, MI (US);
Inventors:
E. Mark Haacke, Grosse Pointe Farms, MI (US);
Jaladhar Neelavalli, Detroit, MI (US);
Assignee:
Magnetic Resonance Innovations, Inc., Detroit, MI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/40 (2006.01); G01J 5/02 (2006.01); A61B 6/00 (2006.01); G01N 23/00 (2006.01); G21K 1/12 (2006.01); H05G 1/60 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of generating a susceptibility map of an object utilizes a regularizing inverse function, oversampling k-space, removing external phase noise and rapid phase change effects, accounting for the known geometry of the object, and using modified SWI phase data to generate reasonable susceptibility maps and digital images therefrom, such as SWI images. The inventors refers to the inventive methods set forth herein as Susceptibility Weighted Imaging and Mapping (SWIM).