The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2013
Filed:
Mar. 17, 2006
Shigeru Uchiyama, Hamamatsu, JP;
Takayuki Inoue, Hamamatsu, JP;
Masatoshi Okugawa, Hamamatsu, JP;
Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
The present invention relates to a microscopic image capturing apparatus having a structure that, in scanning an imageable area of an imaging unit in a predetermined direction in an imaging object area, in which a sample is present, can reliably set a focal point of the imaging unit on each imaging position set inside the imaging object area regardless of the type of focusing actuator. The microscopic image capturing apparatus has a sample setting stage having a sample setting surface that is inclined with respect to a scan plane orthogonal to an optical axis of an objective lens. By moving the sample setting stage along the scan plane such that the distance in the optical axis direction between the imaging unit and the sample setting surface varies monotonously, the focal point position of the imaging unit is adjusted in only one direction along the optical axis of the objective lens.