The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2013
Filed:
Dec. 18, 2006
Applicant:
Sipke Wadman, Waalre, NL;
Inventor:
Sipke Wadman, Waalre, NL;
Assignee:
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/74 (2006.01); G01N 21/57 (2006.01);
U.S. Cl.
CPC ...
Abstract
An optical measurement device for measuring an optical appearance of a surface of a sample includes a measuring head which can be brought into contact with the surface of the sample. The measuring head includes an illumination device for illuminating the surface with an illumination beam, and a detection device or detecting a response beam. The response beam is the response of the sample to the illumination beam. The detection device includes a screen for intercepting the response beam, where the screen extends approximately a quarter hemisphere in order to realize measuring head with a small contact area with the surface.