The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2013

Filed:

Dec. 15, 2010
Applicant:

Cheng-shiun Wu, Taipei Hsien, TW;

Inventor:

Cheng-Shiun Wu, Taipei Hsien, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for testing a lens module is provided. The lens module includes a barrel and a lens received in the barrel. The barrel includes a side surface which is parallel to the central axis thereof. The lens includes a smooth flat non-optical surface. The system includes an alignment device, a position detection device, and a processing device. The alignment device includes a leveling unit and an alignment block including an alignment surface for being in contact with and parallel to the side surface. The leveling unit adjusts the alignment surface to be perpendicular to a horizontal plane such that the side surface is perpendicular to the horizontal plane. The position detection device determines the three dimensional coordinates of three non-collinear points on the non-optical surface. The processing device determines whether the non-optical surface is parallel to the horizontal plane according to the coordinates of the three non-collinear points.


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