The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2013

Filed:

Dec. 08, 2011
Applicants:

Albert Ekladyous, Shelby Township, MI (US);

John W. Wilds, Trenton, MI (US);

Arun Kumar, Farmington Hills, MI (US);

Venkatesan Balaraman, Troy, MI (US);

Sleiman N. Abdelnour, Macomb, MI (US);

Mahendra S. Dassanayake, Bloomfield Hills, MI (US);

Candace C. Glasgow, Canton, MI (US);

Inventors:

Albert Ekladyous, Shelby Township, MI (US);

John W. Wilds, Trenton, MI (US);

Arun Kumar, Farmington Hills, MI (US);

Venkatesan Balaraman, Troy, MI (US);

Sleiman N. Abdelnour, Macomb, MI (US);

Mahendra S. Dassanayake, Bloomfield Hills, MI (US);

Candace C. Glasgow, Canton, MI (US);

Assignee:

Ford Global Technologies, LLC, Dearborn, MI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A headlamp aiming system is provided for aiming a headlamp of a vehicle. An aimer includes a CCD camera for receiving illumination produced by the headlamp to produce a beam pattern image. A controller receives the beam pattern image from the aimer to determine an aiming correction to move the detected beam pattern to a predetermined position. An adjuster is operatively coupled to the vehicle for executing adjustments of the headlamp in response to the aiming correction. The CCD camera captures an initial image using an initial exposure time, measures a light accumulation value corresponding to the initial image, determines a final exposure time in response to the measured light accumulation value and a predetermined light accumulation value, and captures the beam pattern image using the final exposure time.


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