The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2013

Filed:

Dec. 31, 2008
Applicants:

Jeffrey M. Snow, Bloomington, IN (US);

Michael Schumm, Bloomington, IN (US);

William L. Shaff, Bedford, IN (US);

Terry Carlson, Washington, IN (US);

Carl Baker, Avoca, IN (US);

Inventors:

Jeffrey M. Snow, Bloomington, IN (US);

Michael Schumm, Bloomington, IN (US);

William L. Shaff, Bedford, IN (US);

Terry Carlson, Washington, IN (US);

Carl Baker, Avoca, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and software implementation for spatial pattern analysis. A user-guided test procedure is implemented to measure features of an antenna under test to determine the antenna's far-field patterns. The antenna features include RF amplitude or phase, and position and orientation relative to a receiving object.


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