The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2013
Filed:
Sep. 07, 2007
Juliette Mangeney, Cachan, FR;
Paul Crozat, Les Ulis, FR;
Loïc Meignien, Gometz le Chatel, FR;
Jean-michel Lourtioz, Orsay, FR;
Juliette Mangeney, Cachan, FR;
Paul Crozat, Les Ulis, FR;
Loïc Meignien, Gometz le Chatel, FR;
Jean-Michel Lourtioz, Orsay, FR;
Universite Paris Sud, Orsay, FR;
Centre National de la Recherche Scientifique, Paris, FR;
Abstract
A method for characterizing an electric signal (), includes the propagation of a first light beam () through an electro-optical medium () in a first propagation direction, wherein at least one optical property of the medium changes when it is submitted to an electrical field, and the propagation of a second light beam () through the electro-optical medium in a second propagation direction different from the first direction. For each light beam, a measurement of a variation in an optical property of the light beam () due to the propagation of the beam in the medium () is used for determining the propagation direction () of an electric signal () submitting the medium to an electrical field. A device for implementing the method, and an electro-optical probe implemented in the device are also disclosed. Applicability: electro-optical sampling of a component, characterization of electric pulses in guided structures.