The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2013
Filed:
Aug. 07, 2007
Jia-ming Liu, Los Angeles, CA (US);
Enrico Stefani, Los Angeles, CA (US);
Jia-Ming Liu, Los Angeles, CA (US);
Enrico Stefani, Los Angeles, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
Systems and methods that enhance the resolution of a microscope in all three spatial dimensions. A microscope system is provided that typically includes a first objective lens (), an illumination source that provides excitation illumination (λex) at a first wavelength through the objective lens () in a first direction onto a fluorescent sample so as to induce fluorescent emission in the sample at a second wavelength (λfl) different than the first wavelength. The system also typically includes an element () that provides illumination at the second wavelength (λfl) to the sample in a second direction different from the first direction, and a detector () for detecting the fluorescent emission. The optical gain of the fluorescent emission at the second wavelength is enhanced through stimulated emission.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile