The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2013
Filed:
Jan. 14, 2008
Ian Richard Barkshire, Cambridgeshire, GB;
Peter John Statham, Buckinghamshire, GB;
Marcus Jacka, York, GB;
Ian Richard Barkshire, Cambridgeshire, GB;
Peter John Statham, Buckinghamshire, GB;
Marcus Jacka, York, GB;
Abstract
A charged particle analyzer () comprises a first non-imaging electrostatic lens () for receiving charged particles having divergent, trajectories and for converting the said trajectories into substantially parallel trajectories. At least one planar filter () is provided for receiving the charged particles having the substantially parallel trajectories and for filtering the charged particles in accordance with their respective energies. A second non-imaging electrostatic lens () receives the energy filtered charged particles and selectively modifies their trajectories as a function of their energies. A charged particle detector () then receives the charged particles in accordance with their selectively modified trajectories.