The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2013
Filed:
Nov. 12, 2008
Applicants:
Zhong-ping Sun, Watchung, NJ (US);
Shihong LI, Edison, NJ (US);
Conrad Leung, Iselin, NJ (US);
Guo-juan Liao, Edison, NJ (US);
Inventors:
Zhong-Ping Sun, Watchung, NJ (US);
Shihong Li, Edison, NJ (US);
Conrad Leung, Iselin, NJ (US);
Guo-Juan Liao, Edison, NJ (US);
Assignee:
Genewiz Inc., Suzhou, Suzhou, Jiangsu, CN;
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/48 (2006.01);
U.S. Cl.
CPC ...
Abstract
This invention relates to assays for detecting and measuring ADP. In particular, this invention provides homogeneous luminescent assays that detect ADP generation and measures ADP accumulation based on enzymatic coupling reactions. The assays of the present invention can be applied to all types of kinases and other ADP-generating enzymes, are antibody free, beads free, radioisotope free, and compatible with commonly used kinase buffers.