The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2013
Filed:
Nov. 19, 2009
Paul Y. Fung, South River, NJ (US);
David L. Kimball, Flemington, NJ (US);
Stephan M. Linkel, Ewing, NJ (US);
Ralf Mueller, Duesseldorf, DE;
Lionel Robbe, Köln, DE;
Yang Xu, Hamburg, DE;
Paul Y. Fung, South River, NJ (US);
David L. Kimball, Flemington, NJ (US);
Stephan M. Linkel, Ewing, NJ (US);
Ralf Mueller, Duesseldorf, DE;
Lionel Robbe, Köln, DE;
Yang Xu, Hamburg, DE;
McNeil-PPC, Inc., Skillman, NJ (US);
Johnson & Johnson GmbH, Neuss, DE;
Abstract
A packaged elongate intravaginal device has an overwrap substantially enclosing the device. The overwrap has a longitudinal overlap seam disposed generally parallel to the longitudinal axis. The seam includes one ply of overwrap material disposed at a first margin of a overwrap blank superposed on a second ply of overwrap material disposed at a second margin of the overwrap blank, opposite the first. The overwrap has a substantially continuous line of weakness that intersects a plane including the longitudinal axis of the packaged device at at least three unique locations. The line of weakness extends across the longitudinal overlap seam and includes weakness components superposed in each ply of the overlap seam, and the line of weakness is arranged and configured in a manner to permit the overwrap to remain as a unitary structure upon destruction of the line of weakness.