The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2013
Filed:
Oct. 02, 2009
Gyu IL Cha, Daejeon, KR;
Young Ho Kim, Daejeon, KR;
Sung IN Jung, Daejeon, KR;
Electronics and Telecommunications Research Institute, Daejeon, KR;
Abstract
Provided are a software reliability test method using selective fault activation, a test area restriction method, a workload generation method and a computing apparatus for testing software reliability using the same. The software reliability test method registers a test target module. The software reliability test method injects a fault into a fault injection target function when a caller of the fault injection target function is included in the registered module, in a case of calling the fault injection target function.
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