The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2013
Filed:
Feb. 13, 2012
Shayak Banerjee, Austin, TX (US);
Dureseti Chidambarrao, Weston, CT (US);
James A. Culp, Newburgh, NY (US);
Praveen Elakkumanan, Hopewell Junction, NY (US);
Saibal Mukhopadhyay, Atlanta, GA (US);
Shayak Banerjee, Austin, TX (US);
Dureseti Chidambarrao, Weston, CT (US);
James A. Culp, Newburgh, NY (US);
Praveen Elakkumanan, Hopewell Junction, NY (US);
Saibal Mukhopadhyay, Atlanta, GA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for implementing systematic, variation-aware integrated circuit extraction includes inputting a set of processing conditions to a plurality of variation models, each model corresponding to a separate systematic, parametric variation associated with semiconductor manufacturing of an integrated circuit layout; generating, for each variation model, a netlist update attributable to the associated variation, wherein the netlist update is an update with respect to an original netlist extracted from the integrated circuit layout; and storing the netlist updates generated for each of the processing conditions.