The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2013

Filed:

Jun. 07, 2012
Applicants:

Kin Man NG, Tokwawan, HK;

Lingqi Zeng, Turlock, CA (US);

Yu Kou, San Jose, CA (US);

Kwok W. Yeung, Milpitas, CA (US);

Inventors:

Kin Man Ng, Tokwawan, HK;

Lingqi Zeng, Turlock, CA (US);

Yu Kou, San Jose, CA (US);

Kwok W. Yeung, Milpitas, CA (US);

Assignee:

SK hynix memory solutions inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A cost function is obtained. For each of a plurality of groups of check nodes associated with low-density parity-check (LDPC) encoded data, the cost function is evaluated using information associated with a variable node and/or information associated with a check node. One of the groups of check nodes is selecting based at least in part on the evaluated cost functions. Error correction decoding related processing is performed on the selected group of check nodes.


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