The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2013

Filed:

Jan. 25, 2006
Applicants:

Bryan D. Sulzer, Dubuque, IA (US);

Scott J. Breiner, Dubuque, IA (US);

Inventors:

Bryan D. Sulzer, Dubuque, IA (US);

Scott J. Breiner, Dubuque, IA (US);

Assignee:

Deere & Company, Moline, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3183 (2006.01); G01R 31/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to automated hardware in the loop testing. A method of automated diagnostic testing is described as monitoring, modifying, overwriting, providing and/or providing read-only access to input data given to a tested application and output data provided by a tested application to compare a desired relationship between input data and output data. A preferred system includes a communication network with a preferred method including a controller area network to associate a test controlling system to a tested application. An automated diagnostic testing system comprises a test controlling system operably coupled to a tested application.


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