The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2013

Filed:

Oct. 12, 2006
Applicants:

Liwa Wang, Morris Plains, NJ (US);

Yang Yang, Parsippany, NJ (US);

Pengfei Zhu, Morris Plains, NJ (US);

Inventors:

Liwa Wang, Morris Plains, NJ (US);

Yang Yang, Parsippany, NJ (US);

Pengfei Zhu, Morris Plains, NJ (US);

Assignee:

Alcatel Lucent, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method for processor overload control in a wireless or other network, a processor occupancy level ('PO') of a network processing unit is monitored and compared to a target PO. If the measured PO exceeds the target PO, one or more network load sources are controlled to reduce the data load of the processing unit, until the measured PO falls below a designated PO. 'Load source' refers to a source of extant and/or potential data traffic through the processing unit, and/or a network control factor relating thereto, the control of which results in a reduction (or prevents an increase) in the data traffic handled by the processor. Examples include existing data flows, new calls, and BE flow window size. The load sources are controlled according to differentiated QOS levels, wherein non delay-critical data flows (e.g., BE flows) are reduced before delay-critical data flows, e.g., EF or AF flows.


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