The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2013

Filed:

Apr. 21, 2011
Applicants:

Hiroyuki Araki, Sagamihara, JP;

Takashi Hosaka, Mitaka, JP;

Masakazu Omura, Yokohama, JP;

Yusuke Kato, Chofu, JP;

Emiko Ouchi, Chofu, JP;

Ryoichi Hosoya, Orefield, PA (US);

Inventors:

Hiroyuki Araki, Sagamihara, JP;

Takashi Hosaka, Mitaka, JP;

Masakazu Omura, Yokohama, JP;

Yusuke Kato, Chofu, JP;

Emiko Ouchi, Chofu, JP;

Ryoichi Hosoya, Orefield, PA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 50/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A recording unit holds a plurality of examination data including the examination date of a performed examination. A search unit extracts examination data matching a set condition, of the plurality of examination data held in the recording unit. An output unit outputs a search result by the search unit. A first narrowing unit extracts examination data in which the examination date is included within a designated first period. A reference data determination unit classifies the examination data extracted by the first narrowing unit by an examinee and determines, for every examinee, one piece of the examination data to be a reference in accordance with a predetermined rule. A second narrowing unit sets, for every examinee, a second period designated in at least one of the past direction and the future direction starting from a reference date that is the examination date of the examination data determined by the reference data determination unit and extracts examination data in which the examination date is included within the second period.


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