The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2013
Filed:
Oct. 12, 2006
Roberto Cipolla, Cambridge, GB;
George Vogiatzis, Thessalonikis, GR;
Paolo Favaro, Montebulluna, IT;
Ryuji Funayama, Brussels, BE;
Hiromichi Yanagihara, Brussels, BE;
Roberto Cipolla, Cambridge, GB;
George Vogiatzis, Thessalonikis, GR;
Paolo Favaro, Montebulluna, IT;
Ryuji Funayama, Brussels, BE;
Hiromichi Yanagihara, Brussels, BE;
Cambridge University Technical Services Limited, Cambridge, GB;
Abstract
We describe methods of characterizing a set of images to determine their respective illumination, for example for recovering the 3D shape of an illuminated object. The method comprises: inputting a first set of images of the object captured from different positions; determining frontier point data from the images, this defining a plurality of frontier points on the object and for each said frontier point a direction of a normal to the surface of the object at the frontier point, and determining data defining the image capture positions; inputting a second set of images of said object, having substantially the same viewpoint and different illumination conditions; and characterizing the second set of images said frontier point data to determine data comprising object reflectance parameter data (β) and, for each image of said second set, illumination data (L) comprising data defining an illumination direction and illumination intensity for the image.