The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2013
Filed:
Oct. 29, 2009
Carlos A. Ramirez, Miami, FL (US);
Jaesang Park, Miami, FL (US);
Jiuliu LU, Homestead, FL (US);
Beckman Coulter, Inc., Brea, CA (US);
Abstract
Systems and methods for non-linear histogram segmentation for particle analysis are provided. In one embodiment, a method for analyzing particles comprises creating an initial two-dimensional histogram based on two selected parameters of the particles, filtering the initial two-dimensional histogram to generate a filtered two-dimensional image, detecting a plurality of seed populations in the filtered two-dimensional image, generating one or more linear contour lines, each having a plurality of contour points, to separate the detected seed populations, and adjusting the contour points in at least one of the linear contour lines to separate the detected seed populations.