The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2013

Filed:

Jan. 24, 2006
Applicant:

Oliver Schütz, Erlangen, DE;

Inventor:

Oliver Schütz, Erlangen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method and an apparatus for representing an x-ray image of an examination subject, a measurement field is determined in the image field of the x-ray image, the measurement field being dependent on the position of a subject image region representing the examination subject in the image field and being essentially situated within this subject image region grey scale values for the image rendering are determined exclusively from the intensities measured within this measurement field.


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