The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8416913 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 09, 2013

Filed:

Mar. 11, 2008
Applicants:

Naruomi Akino, Nasushiobara, JP;

Satoru Nakanishi, Utsunomiya, JP;

Tetsuya Horiuchi, Tsurugashima, JP;

Inventors:

Naruomi Akino, Nasushiobara, JP;

Satoru Nakanishi, Utsunomiya, JP;

Tetsuya Horiuchi, Tsurugashima, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

X-ray transmission data of a specific direction is extracted from X-ray transmission data obtained by rotating an X-ray tube irradiating an X-ray around an object. The outline of the object is calculated based on the X-ray transmission data of the specific direction. Then, based on this outline, the X-ray transmission data is corrected, and an image of the inside of the object is reconstructed from the corrected X-ray transmission data.


Find Patent Forward Citations

Akino, Naruomi. (2013). X-ray ct system, object-outline estimating method, and image reconstructing method (U.S. Patent No. 8416913). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8416913

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