The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2013
Filed:
Jun. 22, 2010
Eugene Olczak, Pittsford, NY (US);
Eugene Olczak, Pittsford, NY (US);
Exelis, Inc., McLean, VA (US);
Abstract
An optical testing system includes a computer generated hologram (CGH) and an imaging element (IE). Both are disposed in a path of light traveling between a wavefront measuring system (WMS) and an object under test. The CGH is located a first distance from the WMS and the IE is located a second distance from the WMS. The IE is further away from the WMS, than the CGH is from the WMS, along the path of light. The center of curvature (CoC) of the object under test is also disposed in the path of light, in which the CoC is located a third distance from the WMS. The third distance is larger than the second distance, along the path of light. The IE forms an image of the object under test at the CGH; and the CGH is configured to provide a null wavefront for the image of the object under test at the CGH. The null wavefront is received by the WMS. Moreover, the IE of the optical testing system may include an imaging lens having a planar surface facing away from the CGH and a convex surface facing toward the CGH. The IE may also include an imaging mirror.