The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2013

Filed:

Oct. 05, 2010
Applicants:

Ronald R. Hatch, Willington, CA (US);

Liwen L. Dai, Chino Hills, CA (US);

Inventors:

Ronald R. Hatch, Willington, CA (US);

Liwen L. Dai, Chino Hills, CA (US);

Assignee:

Navcom Technology, Inc., Torrance, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 19/20 (2010.01);
U.S. Cl.
CPC ...
Abstract

A system and method for compensating for faulty satellite navigation measurements. A plurality of measurements in a system is received for a measurement epoch. A Kalman filter is used to calculate a state of the system for the measurement epoch based on the plurality of measurements, wherein the state of the system for the measurement epoch is calculated using a first closed-form update equation. A faulty measurement is detected in the plurality of measurements for the measurement epoch and a revised state of the system for the measurement epoch that compensates for the faulty measurement is calculated, using the calculated state of the system for the measurement epoch as an input to the revised state calculation, and using a revised closed-form update equation comprising the first closed-form update equation modified with respect to the faulty measurement.


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