The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2013

Filed:

Oct. 28, 2011
Applicants:

Joel T. Ficke, Bloomer, WI (US);

Grant P. Kesselring, Rochester, MN (US);

James D. Strom, Rochester, MN (US);

Inventors:

Joel T. Ficke, Bloomer, WI (US);

Grant P. Kesselring, Rochester, MN (US);

James D. Strom, Rochester, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A screening method and circuit for implementing a Physically Unclonable Function (PUF), and a design structure on which the subject circuit resides are provided. A plurality of field effect transistors (FETs) is coupled to a low-offset dynamic comparator and is respectively selected to provide a plurality of FET pairs. For each FET pair, a voltage offset to obtain a comparator output transition is identified and recorded. The recorded voltage offset for each FET pair is compared with a margin threshold value. Each FET pair having an identified voltage offset less than the margin threshold value is discarded or disabled for PUF response generation use.


Find Patent Forward Citations

Ficke, Joel. (2013). Implementing screening for single fet compare of physically unclonable function (puf) (U.S. Patent No. 8415969). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8415969

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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