The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2013

Filed:

Jul. 23, 2009
Applicants:

Da-hye Cho, Goyang-si, KR;

Ji-young Jeong, Cheonan-si, KR;

Jae-ho Lee, Cheonan-si, KR;

Seung-jin Kim, Cheonan-si, KR;

Inventors:

Da-Hye Cho, Goyang-si, KR;

Ji-Young Jeong, Cheonan-si, KR;

Jae-Ho Lee, Cheonan-si, KR;

Seung-Jin Kim, Cheonan-si, KR;

Assignee:

Samsung Display Co., Ltd., Yongin, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a test method of a display panel, a test signal and a test voltage are generated according to a test control signal. A display area of the display panel is tested based on the test signal and the test voltage. A driving voltage line and an on/off voltage line formed on the display panel are tested based on the test signal and the test voltage.


Find Patent Forward Citations

Cho, Da-Hye. (2013). Method of testing a display panel and apparatus for performing the method (U.S. Patent No. 8415965). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8415965

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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