The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2013

Filed:

Nov. 23, 2010
Applicants:

Frank B. Jaworski, Goleta, CA (US);

Moungi Bawendi, Cambridge, MA (US);

Scott M. Geyer, Cambridge, MA (US);

Inventors:

Frank B. Jaworski, Goleta, CA (US);

Moungi Bawendi, Cambridge, MA (US);

Scott M. Geyer, Cambridge, MA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/0232 (2006.01);
U.S. Cl.
CPC ...
Abstract

In certain embodiments, an apparatus for down-converting and detecting photons includes a detector layer and a nanocrystal layer. The nanocrystal layer includes nanocrystals operable to absorb first photons of a higher energy and emit second photons of a lower energy in response to the absorption. The detector layer is configured to detect the second photons. In certain embodiments, a method for manufacturing an apparatus for down-converting and detecting photons includes preparing an outer surface of a substrate. Nanocrystals are disposed outwardly from the outer surface. The nanocrystals are operable to absorb first photons of a higher energy and emit second photons of a lower energy in response to the absorption.


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