The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2013
Filed:
Mar. 09, 2010
Leonid Tsukerman, Q. Mozkin, IL;
Floribertus P. M. Heukensfeldt Jansen, Ballston Lake, NY (US);
Ira Blevis, Zichron Yaakov, IL;
Jean-paul Bouhnik, Zichron Yaacov, IL;
Leonid Tsukerman, Q. Mozkin, IL;
Floribertus P. M. Heukensfeldt Jansen, Ballston Lake, NY (US);
Ira Blevis, Zichron Yaakov, IL;
Jean-Paul Bouhnik, Zichron Yaacov, IL;
General Electric Company, Schenectady, NY (US);
Abstract
Methods and systems for calibrating a nuclear medicine imaging system are provided. One method includes acquiring spatially determined non-uniform radiation flux information from a calibration scan of a calibration source using a gamma camera having an attached non-parallel-hole collimator. The method further includes determining a measured non-uniform count density profile from the acquired non-uniform radiation flux information. The method also includes creating a gamma camera uniformity correction map derived from (i) the measured non-uniform count density profile and (ii) a modeled or calculated non-uniform count density profile for calibrating the NM imaging system.