Total reflection terahertz wave measurement device

Abstract

A total reflection terahertz wave measuring apparatusincludes a light source, a branching part, a chopper, an optical path length difference adjusting part, a polarizer, a beam splitter, a terahertz wave generating element, a filter, an internal total reflection prism, a terahertz wave detecting element, a ¼ wavelength plate, a polarization split element, a photodetector, a photodetector, a differential amplifier, and a lock-in amplifier. The internal total reflection prismis a so-called aplanatic prism, and has an entrance surface, an exit surface, and a reflection surface. The terahertz wave generating elementand the filterare provided to be integrated with the entrance surfaceof the internal total reflection prism, and the terahertz wave detecting elementis provided to be integrated with the exit surfaceof the internal total reflection prism. The filterallows a terahertz wave to be transmitted therethrough and blocks pump light. Accordingly, a total reflection terahertz wave measuring apparatus, which can be downsized, can be realized.