The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2013
Filed:
Nov. 07, 2008
Applicants:
Olivier Pigouche, Grasse, FR;
Didier Dantes, Valbonne, FR;
Inventors:
Olivier Pigouche, Grasse, FR;
Didier Dantes, Valbonne, FR;
Assignee:
Thales, Neuilly-sur-Seine, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G02B 27/64 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to a device for measuring defects of an imaging instrument with a sensor that is accurate, simple to produce and implement and inexpensive. According to the invention, this device comprising at least one second sensor, similar to the first, inclined relative thereto and imaging the same region as the first sensor, and a device for calculating the defocusing of each element of this other sensor.
Quick Actions:
Pigouche, Olivier. (2013). Device for measuring the defects of an imaging instrument with two opto-electronic sensors (U.S. Patent No. 8415599). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8415599
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile