The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2013

Filed:

Jul. 23, 2010
Applicants:

Pei-chung Wang, Shanghai, CN;

Daniel C. Hutchinson, Goodrich, MI (US);

Michael J. Karagoulis, Okemos, MI (US);

Sheila A. Marin, Silver Spring, MD (US);

Inventors:

Pei-Chung Wang, Shanghai, CN;

Samuel P. Marin, Oakland Township, MI (US);

Daniel C. Hutchinson, Goodrich, MI (US);

Michael J. Karagoulis, Okemos, MI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 9/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of monitoring and maintaining a weld cap which is executing successive resistance welds on a plurality of workpieces includes measuring a first weld indentation formed during a first resistance weld and measuring a second weld indentation formed during a second resistance weld. The measured first and second weld indentations are compared with a severe threshold. If either of the measured first or second weld indentations is greater than the severe threshold, an abnormal condition is signaled. The method may include tip dressing the weld cap based upon the signaled abnormal condition. The method may further include determining a degradation rate between the first resistance weld and the second resistance weld. The degradation rate is the time differential between the measured first and second weld indentations, and either a first or a second tip dressing schedule is chosen based upon the determined degradation rate.


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