The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2013

Filed:

Dec. 02, 2010
Applicants:

Masakazu Endo, Aichi, JP;

Noriji Kawai, Aichi, JP;

Yasuhisa Murakami, Aichi, JP;

Inventors:

Masakazu Endo, Aichi, JP;

Noriji Kawai, Aichi, JP;

Yasuhisa Murakami, Aichi, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An eye distance measurement apparatus according to one aspect of the invention includes an interfering optical system that projects at least one piece of split light toward an examinee's eye, combines the split light, guides the combined light to a light receiving device and moves an optical member in order to adjust an optical path difference between the two pieces of split light, a mode switching unit that issues a mode switching signal for switching between a first measurement mode for moving the optical member at a first scanning rate and a second measurement mode for moving the optical member at a second scanning rate slower than the first scanning rate, and a calculation and control unit that measures an eye distance, based on an output signal of the light receiving device, obtained in the measurement mode corresponding to the mode switching signal.


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