The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8413516 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 09, 2013

Filed:

Mar. 17, 2010
Applicants:

Kazuhiro Noguchi, Tokyo, JP;

Noritaka Nakaso, Tokyo, JP;

Inventors:

Kazuhiro Noguchi, Tokyo, JP;

Noritaka Nakaso, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

The elastic wave measurement apparatus, when a high-frequency burst signal is input to the first ball SAW device, an input destination of the high-frequency burst signal is switched in sequence to another one of the ball SAW devices before a detection time at which an output signal from the first ball SAW device is detected, and at and after the detection time, output signals of the response characteristics of those ball SAW devices from the first ball SAW device to the last ball SAW device are detected in sequence.


Find Patent Forward Citations

Noguchi, Kazuhiro. (2013). Elastic wave measurement apparatus and method (U.S. Patent No. 8413516). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8413516

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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