The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2013
Filed:
Feb. 26, 2009
Hideo Isobe, Tokyo, JP;
Hirokazu Karasawa, Kanagawa-ken, JP;
Hideo Isobe, Tokyo, JP;
Hirokazu Karasawa, Kanagawa-ken, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
There is provided an ultrasonic inspection apparatus which detects various deviations with respect to an ideal scanning position and achieves, with high accuracy, an ultrasound flaw inspection by autonomously adjusting the deviations. The ultrasonic inspection apparatus according to the present invention is provided with an integrated type ultrasound transducer including an ultrasonic transducer, an integral type ultrasound transducer control unit, an actuator for distance adjustment, an actuator for tilt control, and a distance measuring sensor. The integrated type ultrasound transducer calculates a deviation between a scanning position based on a preliminarily generated scanning path information and an ideal scanning position, and performs a deviation correction processing by autonomously controlling a distance and a tilt between an opening surface of the ultrasound transducer and an inspection region of an object to be inspected in accordance with this deviation.