The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2013
Filed:
Mar. 24, 2009
Yoshio Ueda, Osaka, JP;
Masaki Yamano, Osaka, JP;
Masami Ikeda, Osaka, JP;
Nippon Steel & Sumitomo Metal Corporation, Tokyo, JP;
Abstract
An ultrasonic testing equipment includes a linear array ultrasonic probe in which a plurality of transducers are arranged in a direction orthogonal to the rolling direction of a test object and a signal processing unit. The signal processing unit executes following (1) to (6). (1) Generating an aperture synthetic image of testing signals of each section of the test object. (2) Generating a maximum value distribution of testing signals in the arrangement direction of transducers. (3) Calculating the width of a defect in each section based on the maximum value distribution. (4) Generating a maximum value distribution of the testing signals in the rolling direction based on the maximum value distribution of a plurality of sections of the test object. (5) Calculating the length of the defect based on the maximum value distribution of the testing signals in the rolling direction. (6) Calculating the area of the defect based on the calculated defect length and the calculated defect width of each section.