The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2013

Filed:

Aug. 21, 2009
Applicants:

Kenta Takahashi, Kamakura, JP;

Shinji Hirata, Chigasaki, JP;

Yoshiaki Isobe, Yokohama, JP;

Inventors:

Kenta Takahashi, Kamakura, JP;

Shinji Hirata, Chigasaki, JP;

Yoshiaki Isobe, Yokohama, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

At registration time, feature data array for registration is generated from biometric information, and position correction template and comparison template. At authentication time, feature data array for authentication is generated from biometric information acquired by the client, and converted feature data for position correction obtained by converting the feature data array for authentication is transmitted to the server. The server detects position correction amount of the feature data array for authentication relative to the feature data array for registration using the position correction template and the converted feature data, and transmits the position correction amount to client. Client corrects the feature data array for authentication and transmits the converted feature data array for comparison to the server. Server calculates a distance between the comparison template and the converted feature data array for comparison and determines success or failure of the authentication on the basis of the distance.


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