The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2013

Filed:

Apr. 26, 2010
Applicants:

Peter Zei-chan Yeh, San Jose, CA (US);

Sanjay Mathur, Sunnyvale, CA (US);

Scott W. Kurth, Arlington Heights, IL (US);

John Mills Akred, San Jose, CA (US);

Erin Jennifer Maneri, San Jose, CA (US);

John Y. Miller, Toronto, CA;

Inventors:

Peter Zei-Chan Yeh, San Jose, CA (US);

Sanjay Mathur, Sunnyvale, CA (US);

Scott W. Kurth, Arlington Heights, IL (US);

John Mills Akred, San Jose, CA (US);

Erin Jennifer Maneri, San Jose, CA (US);

John Y. Miller, Toronto, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, in one embodiment, can include encoding knowledge about a topic domain into a data modeling technique. Additionally, a set of candidate conditional functional dependencies can be generated based on a data set of the topic domain. Moreover, the set of candidate conditional functional dependencies and the data modeling technique encoded with the topic domain knowledge can be applied to the data set to obtain a plurality of data quality rules for the data set.


Find Patent Forward Citations

Loading…