The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2013

Filed:

May. 20, 2008
Applicants:

Daren K. Fairfield, Holland, MI (US);

Melissa R. Zilinski, Medfield, MA (US);

Chris Chapman, London, GB;

Arsenio M. Santos, Sao Paulo, BR;

Inventors:

Daren K. Fairfield, Holland, MI (US);

Melissa R. Zilinski, Medfield, MA (US);

Chris Chapman, London, GB;

Arsenio M. Santos, Sao Paulo, BR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2012.01); G06Q 30/00 (2012.01);
U.S. Cl.
CPC ...
Abstract

A capability analysis structure helps a modern business meet the challenges of the global marketplace. As a result, the business can achieve the clarity, consistency, and well-defined execution of its core processes that reduce inefficiencies and waste due to unnecessary process complexity and exceptions. In addition, the capability analysis structure helps the business to identify specific areas in which improvements may be made and understand how to make the improvements, and establishes levels of capability along the way to reaching an ultimate capability goal.


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