The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2013

Filed:

Jun. 25, 2009
Applicants:

Hitoshi Yanami, Kawasaki, JP;

Hirokazu Anai, Kawasaki, JP;

Inventors:

Hitoshi Yanami, Kawasaki, JP;

Hirokazu Anai, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus receives input of sample sets, each including a set of values of design parameters and a set of values of objective functions; calculates objective function approximating equations; and selects, as initial candidates for an optimal design parameter set, some sets of values of design parameters corresponding to non-dominated solutions. The apparatus calculates one or more interpolating design parameter sets interpolating between two adjacent components in the candidates; and approximates values of the objective functions for each interpolating design parameter set. The apparatus selects an optimal interpolating design parameter set corresponding to a non-dominated solution in the cost evaluation for a pair of objective functions; and integrates it into the candidates. The apparatus repeats processes on the new candidates while determining the parameter distance between components of the new candidates. Finally obtained new candidates are output as final optimal design parameter sets and information relating to it is displayed.


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