The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2013

Filed:

Sep. 09, 2010
Applicants:

Robert C. Kain, San Diego, CA (US);

David L. Heiner, San Diego, CA (US);

Chanfeng Zhao, San Diego, CA (US);

Kevin Gunderson, Encinitas, CA (US);

Inventors:

Robert C. Kain, San Diego, CA (US);

David L. Heiner, San Diego, CA (US);

Chanfeng Zhao, San Diego, CA (US);

Kevin Gunderson, Encinitas, CA (US);

Assignee:

Illumina, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique for sequencing nucleic acids in an automated or semi-automated manner is disclosed. Sample arrays of a multitude of nucleic acid sites are processed in multiple cycles to add nucleotides to the material to be sequenced, detect the nucleotides added to sites, and to de-block the added nucleotides of blocking agents and tags used to identify the last added nucleotide. Multiple parameters of the system are monitored to enable diagnosis and correction of problems as they occur during sequencing of the samples. Quality control routines are run during sequencing to determine quality of samples, and quality of the data collected.


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