The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2013

Filed:

Dec. 08, 2009
Applicants:

Liang Zhang, Ottawa, CA;

Demin Wang, Ottawa, CA;

Houman Rastgar, Thornhill, CA;

André Vincent, Gatineau, CA;

Inventors:

Liang Zhang, Ottawa, CA;

Demin Wang, Ottawa, CA;

Houman Rastgar, Thornhill, CA;

André Vincent, Gatineau, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method for estimating an image relation model for two or more related images based on a plurality of point correspondences. The method includes using a weighted random sampling algorithm to repeatedly draw subsets of point correspondences for generating model estimates, evaluating said model estimates for the full plurality of the point correspondences, and updating weights associated with each of the point correspondences in the random sampling algorithm based on information obtained in said evaluating.


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