The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2013
Filed:
Feb. 29, 2012
Akinola Akinyemi, Edinburgh, GB;
Ian Poole, Edinburgh, GB;
Costas Plakas, Edinburgh, GB;
Jim Piper, Edinburgh, GB;
Akinola Akinyemi, Edinburgh, GB;
Ian Poole, Edinburgh, GB;
Costas Plakas, Edinburgh, GB;
Jim Piper, Edinburgh, GB;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Abstract
According to one embodiment there is provided a method of selecting a plurality of M atlases from among a larger group of N candidate atlases to form a multi-atlas data set to be used for computer automated segmentation of novel image data sets to mark objects of interest therein. A set of candidate atlases is used containing a reference image data set and segmentation data. Each of the candidate atlases is segmented against the others in a leave-one-out strategy, in which the candidate atlases are used as training data for each other. For each candidate atlas in turn, the following is carried out: registering; segmenting; computing an overlap; computing a value of the similarity measure for each of the registrations; and obtaining a set of regression parameters by performing a regression with the similarity measure being the independent variable and the overlap being the dependent variable.