The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2013
Filed:
Oct. 05, 2010
Ti-chiun Chang, Princeton Junction, NJ (US);
Yunqiang Chen, Plainsboro, NJ (US);
Michelle Xiaohong Yan, Princeton, NJ (US);
Tong Fang, Morganville, NJ (US);
Ti-chiun Chang, Princeton Junction, NJ (US);
Yunqiang Chen, Plainsboro, NJ (US);
Michelle xiaohong Yan, Princeton, NJ (US);
Tong Fang, Morganville, NJ (US);
Siemens Aktiengesellschaft, München, DE;
Abstract
A method for detecting markers within X-ray images includes applying directional filters to a sequence of X-ray image frames. Marker candidate pixels are determined based on the output of the directional filters. Candidate pixels are grouped into clusters and distances between each possible pair of clusters is determined and the most frequently occurring distance is considered an estimated distance between markers. A first marker is detected at the cluster that most closely resembles a marker based on certain criteria and a second marker is then detected at a cluster that is the estimated distance from the first marker. The pair of first and second marker detections is scored to determine detection quality. If the detected marker pair has an acceptable score then the detected marker pair is used.