The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2013
Filed:
Apr. 26, 2010
Bing Feng, Knoxville, TN (US);
Bing Feng, Knoxville, TN (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
A system and method is provided for reconstructing single photon emission computed tomography data acquired with a pinhole collimator without pre-knowledge of 3D coordinates of point source markers. The system and method include reiteratively applying a downhill simplex process to determine a first parameter and a second parameter, keeping a lowest vertex from a previous iteration, randomly resetting starting values for rest vertexes for a current iteration, wherein the lowest vertex is prevented from performing a last iteration, determining whether at least one of a first threshold and a second threshold has been reached, wherein the first threshold comprises a cost function value and the second threshold comprises a predetermined number of iterations of the downhill simplex process, acquiring projection data from the first parameter, determining locations of 2D data from the projection data of the first parameter; and estimating the second parameter by fitting the forward projected data locations to the measured data locations.