The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2013
Filed:
Nov. 29, 2010
Koji Maeda, Kodaira, JP;
Taizo Yamawaki, Tokyo, JP;
Yukinori Akamine, Kokubunji, JP;
Renesas Electronics Corporation, Kawasaki-shi, JP;
Abstract
The semiconductor integrated communication circuit includes: a low-noise amplifier; a receive mixer; a receive VCO; a demodulation-processing circuit; a modulation-processing circuit; a transmit mixer; a transmit VCO; a second-order-distortion-characteristic-calibration circuit; a quadrature-receive-signal-calibration circuit; and a test-signal generator. The test-signal generator generates first and second test signals using the transmit VCO. In the second-order-distortion-characteristic-calibration mode, the second-order-distortion-characteristic-calibration circuit variably changes an operation parameter of the receive mixer thereby to calibrate the second-order distortion characteristic to achieve its best condition while the first test signal is supplied to the receive mixer. In the quadrature-receive-signal-calibration mode, the quadrature-receive-signal-calibration circuit calibrates IQ mismatch of a quadrature receive signal to achieve the best condition thereof while the second test signal is supplied to the receive mixer. The integrated communication circuit can minimize the increase in chip footprint of a test-signal-generating circuit used to perform calibrations of both the second-order characteristic and IQ mismatch.