The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2013
Filed:
Jun. 16, 2011
Makoto Ogawa, Nagaokakyo, JP;
Akihiro Motoki, Nagaokakyo, JP;
Masahito Saruban, Nagaokakyo, JP;
Toshiyuki Iwanaga, Nagaokakyo, JP;
Syunsuke Takeuchi, Nagaokakyo, JP;
Kiyoyasu Sakurada, Nagaokakyo, JP;
Makoto Ogawa, Nagaokakyo, JP;
Akihiro Motoki, Nagaokakyo, JP;
Masahito Saruban, Nagaokakyo, JP;
Toshiyuki Iwanaga, Nagaokakyo, JP;
Syunsuke Takeuchi, Nagaokakyo, JP;
Kiyoyasu Sakurada, Nagaokakyo, JP;
Murata Manufacturing Co., Ltd., Kyoto, JP;
Abstract
When an external terminal electrode of a ceramic electronic component such as a laminated ceramic capacitor is formed by plating, plating growth may be also caused even in an undesired location. The ceramic surface provided by a component main body is configured to include a high plating growth region of, for example, a barium titanate based ceramic, which exhibits relatively high plating growth, and a low plating growth region of, for example, a calcium zirconate based ceramic, which exhibits relatively low plating growth. The plating film constituting a first layer to define a base for an external terminal electrode is formed in such a way that the growth of a plated deposit deposited with conductive surfaces provided by exposed ends of internal electrodes as starting points is limited so as not to cross over a boundary between the high plating growth region and the low plating growth region toward the low plating growth region.